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IRFP3006PBF Arkusz danych(PDF) 7 Page - International Rectifier |
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IRFP3006PBF Arkusz danych(HTML) 7 Page - International Rectifier |
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7 / 9 page ![]() IRFP3006PbF 7 www.irf.com © 2013 International Rectifier September 06, 2013 Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs Fig 22b. Unclamped Inductive Waveforms Fig 22a. Unclamped Inductive Test Circuit Fig 23a. Switching Time Test Circuit Fig 23b. Switching Time Waveforms Fig 24a. Gate Charge Test Circuit Fig 24b. Gate Charge Waveform |
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