| Zakładka z wyszukiwarką danych komponentów |
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DS75 Arkusz danych(PDF) 4 Page - Dallas Semiconductor |
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DS75 Arkusz danych(HTML) 4 Page - Dallas Semiconductor |
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4 / 13 page ![]() DS75 4 of 13 Temperature/Data Relationships Table 2 S2 6 2 5 2 4 2 3 2 2 2 1 2 0 MSB MSb (UNIT = °C) LSb 2 –1 2 –2 2 –3 2 –4 00 00 LSB TEMPERATURE/DATA RELATIONSHIPS Table 2 cont’d TEMP DIGITAL OUTPUT (Binary) DIGITAL OUTPUT (Hex) +125 °C 0111 1101 0000 0000 7D00h +25.0625 °C 0001 1001 0001 0000 1910h +10.125 °C 0000 1010 0010 0000 0A20h +0.5 °C 0000 0000 1000 0000 0080h +0 °C 0000 0000 0000 0000 0000h –0.5 °C 1111 1111 1000 0000 FF80h –10.125 °C 1111 0101 1110 0000 E5E0h –25.0625 °C 1110 0110 1111 0000 E6F0h –55 °C 1100 1001 0000 0000 C900h OPERATION–Thermostat Control In its comparator operating mode, the DS75 functions as a thermostat with programmable hysteresis, as shown in Figure 2. When the DS75’s temperature meets or exceeds the value stored in the high tempera- ture trip register (TOS ) a consecutive number of times defined by the configuration register, the output becomes active, and will stay active until the temperature falls below the temperature stored in the low temperature trigger register (THYST ) the first time. In this way, any amount of hysteresis may be obtained. The DS75 powers up in the comparator mode with TOS =80 °C and T HYST =75 °C, and the device can be used as a standalone thermostat (no 2–wire interface required) with those setpoints. In the interrupt mode, the O.S. output will first become active following the programmed number of consecutive conversions above TOS . The fault can only be cleared by either setting the DS75 in a shutdown mode or by reading any register (temperature, configuration, TOS, or THYST ) on the device. Following a clear, a subsequent fault can only occur if consecutive conversions fall below THYST. This interrupt/clear process is thus cyclical (TOS, clear, THYST, clear, TOS, clear, THYST, clear, . . .). Only the first of multiple consecutive TOS violations will activate O.S., even if each fault is separated by a clearing function. The same situation applies to multiple consecutive THYST events. |
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