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54HSC Arkusz danych(PDF) 4 Page - Dynex Semiconductor

Numer części 54HSC
Szczegółowy opis  Radiation hard 16-Bit ParallelError Detection & Correction
PDF  10 Pages
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Producent  DYNEX [Dynex Semiconductor]
Strona internetowa  http://www.dynexsemi.com
Logo DYNEX - Dynex Semiconductor

54HSC Arkusz danych(HTML) 4 Page - Dynex Semiconductor

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Figure 3: Error Detection and Correction Using Two EDAC Units
S1
S0
Function
L
H
Start READ
H
H
Latch data & flag errors
H
L
Correct data & Output syndrome bits
DC CHARACTERISTICS AND RATINGS
Parameter
Min
Max
Units
Supply Voltage
-0.5
7
V
Input Voltage
VSS-0.3
VDD+0.3
V
Current Through Any Pin
-20
+20
mA
Operating Temperature
-55
125
°C
Storage Temperature
-65
150
°C
Note: Stresses above those listed may cause permanent
damage to the device. This is a stress rating only and
functional operation of the device at these conditions, or at
any other condition above those indicated in the operations
section of this specification, is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability.
Table 5: Absolute Maximum Ratings
Subgroup
Definition
1
Static characteristics specified in Table 6 at +25
°C
2
Static characteristics specified in Table 6 at +125
°C
3
Static characteristics specified in Table 6 at -55
°C
9
Switching characteristics specified in Table 7 at +25
°C
10
Switching characteristics specified in Table 7 at +125
°C
11
Switching characteristics specified in Table 7 at -55
°C
DEFINITION OF SUBGROUPS



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