IO13PDB0V0 datasheet(88/197 Pages) MICROSEMI

88 / 197 page

SmartFusion DC and Switching Characteristics

2- 76

R e v i sio n 1 2

Embedded FlashROM (eFROM)

Electrical Characteristics

Table 2-91 describes the eFROM maximum performance

JTAG 1532 Characteristics

JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to

the corresponding standard selected; refer to the I/O timing characteristics in the "User I/O

Characteristics" section on page 2-19 for more details.

Timing Characteristics

Table 2-91 • FlashROM Access Time, Worse Commercial Case Conditions: TJ = 85°C, VCC = 1.425 V

Parameter

Description

–1

Std.

Units

tCK2Q

Clock to out per configuration*

28.68

32.98

Fmax

Maximum Clock frequency

15.00

MHz

Table 2-92 • JTAG 1532

Worst Commercial-Case Conditions: TJ = 85°C, Worst-Case VCC = 1.425 V

Parameter

Description

–1

Std.

Units

tDISU

Test Data Input Setup Time

0.67

0.77

tDIHD

Test Data Input Hold Time

1.33

1.53

tTMSSU

Test Mode Select Setup Time

0.67

0.77

tTMDHD

Test Mode Select Hold Time

1.33

1.53

tTCK2Q

Clock to Q (data out)

8.00

9.20

tRSTB2Q

Reset to Q (data out)

26.67

30.67

FTCKMAX

TCK Maximum Frequency

19.00

21.85

MHz

tTRSTREM

ResetB Removal Time

0.00

tTRSTREC

ResetB Recovery Time

0.27

0.31

tTRSTMPW

ResetB Minimum Pulse

TBD

Note:

For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values.

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