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SN74LVC2G53 Arkusz danych(PDF) 2 Page - Texas Instruments |
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SN74LVC2G53 Arkusz danych(HTML) 2 Page - Texas Instruments |
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2 / 23 page ![]() COM Y Y2 A INH Y1 COM 5 2 7 6 1 SW SW NOTE A: For simplicity, the test conditions shown in Figures 1 through 4 and 6 through 10 are for the demultiplexer configuration. Signals can be passed from COM to Y1 (Y2) or from Y1 (Y2) to COM. SN74LVC2G53 SCES324N – JULY 2001 – REVISED JANUAY 2014 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Function Table CONTROL ON INPUTS CHANNEL INH A L L Y1 L H Y2 H X None Logic Diagram (Positive Logic) Simplified Schematic, Each Switch (SW) 2 Submit Documentation Feedback Copyright © 2001–2014, Texas Instruments Incorporated Product Folder Links :SN74LVC2G53 |
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