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GL494 Arkusz danych(PDF) 3 Page - Hynix Semiconductor

Numer części GL494
Szczegółowy opis  PWM CONTROL CIRCUIT
PDF  7 Pages
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Producent  HYNIX [Hynix Semiconductor]
Strona internetowa  http://www.skhynix.com/kor/main.do
Logo HYNIX - Hynix Semiconductor

GL494 Arkusz danych(HTML) 3 Page - Hynix Semiconductor

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GL494
3
Dead Time Control Section
PARAMETER
TEST CONDITIONS
MIN
TYP(1)
MAX
UNIT
Input bias current (pin 4)
VI=0 to 5.25V
-2
-10
A
µ
Maximum duty cycle,
Each output
)
4
pin
(
I
V
=0V
45
%
Zero duty cycle
3
3.3
V
Input threshold voltage
(pin 4)
Maximum duty cycle
0
V
Error Amp Sections
PARAMETER
TEST CONDITIONS
MIN
TYP(1)
MAX
UNIT
Input offset voltage
V
5
.
2
V
)
3
PIN
(
O
=
2
10
mV
Input offset current
V
5
.
2
V
)
3
PIN
(
O
=
25
250
nA
Input bias current
V
5
.
2
V
)
3
PIN
(
O
=
0.2
1
A
µ
LOW
-0.3
Common-mode input
voltage range
V
7
VCC =
to 40V
HIGH
2
V
CC −
V
Open-loop voltage
Amplification
5
.
0
V
,
V
3
V
O
O
=
=
∆
to3.
5V
70
95
dB
Unity-gain bandwidth
800
KHz
Common-mode rejection ratio
V
40
VCC =
,
C
25
TA
°
=
65
80
dB
Output sink current (pin 3)
mV
15
VID
−
=
to –5V,
V
7
.
0
V
)
3
pin
(
O
=
0.3
0.7
mA
Output source current (pin 3)
mV
15
VID =
to 5V,
V
5
.
3
V
)
3
pin
(
O
=
-2
mA
PWM Comparaor Section
PARAMETER
TEST CONDITIONS
MIN
TYP(1)
MAX
UNIT
Input threshold voltage (pin 3)
Zero duty cycle
4
4.5
V
Input sink current (pin 3)
V
7
.
0
V
)
3
pin
(
O
=
0.3
0.7
mA
Switching Characteristics
PARAMETER
TEST CONDITIONS
MIN
TYP(1)
MAX
UNIT
Output Voltage rise time
100
200
ns
Output Voltage fall time
Common-emitter configuration,
See Test Circuit 3
25
100
ns
Output Voltage rise time
100
200
ns
Output Voltage fall time
Emitter-follower configuration,
See Test Circuit 4
40
100
ns



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