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STAC9704 Arkusz danych(PDF) 33 Page - Hynix Semiconductor |
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STAC9704 Arkusz danych(HTML) 33 Page - Hynix Semiconductor |
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33 / 49 page ![]() SigmaTel, Inc. STAC9704/7 33 10/02/98 6. TESTABILITY The STAC9704/7 has two test modes. One is for ATE in-circuit test and the other is restricted for SigmaTel’s internal use. STAC9704/7 enters the ATE in circuit test mode if SDATA_OUT is sampled high at the trailing edge of RESET#. Once in the ATE test mode, the digital AC-link outputs (BIT_CLK and SDATA_IN) are driven to a high impedance state. This allows ATE in-circuit testing of the AC’97 controller. This case will never occur during standard operating conditions. Once either of the two test modes have been entered, the STAC9704/7 must be issued another rest with all AC-link signals held low to return to the normal operating mode. |
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