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IDT6167LA55Y Arkusz danych(PDF) 2 Page - Integrated Device Technology

Numer części IDT6167LA55Y
Szczegółowy opis  CMOS STATIC RAM 16K (16K x 1-BIT)
PDF  8 Pages
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Producent  IDT [Integrated Device Technology]
Strona internetowa  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT6167LA55Y Arkusz danych(HTML) 2 Page - Integrated Device Technology

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5.2
2
IDT6167SA/LA
CMOS STATIC RAM 16K (16K x 1-BIT)
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
DIP/SOJ
TOP VIEW
PIN DESCRIPTIONS
A0–A13
Address Inputs
CS
Chip Select
WE
Write Enable
VCC
Power
DIN
DATAIN
DOUT
DATAOUT
GND
Ground
2981 tbl 01
2981 drw 02
5
6
7
8
9
10
A0
1
2
3
4
20
P20-1,
D20-1,
&
S020-1
A1
A2
A3
A4
A5
A6
VCC
CS
A13
A12
DIN
WE
GND
A11
A10
DOUT
19
18
17
16
15
14
13
12
11
A9
A8
A7
RECOMMENDED OPERATING
TEMPERATURE AND SUPPLY VOLTAGE
Grade
Temperature
GND
VCC
Military
–55
°C to +125°C
0V
5V
± 10%
Commercial
0
°C to +70°C
0V
5V
± 10%
2981 tbl 06
TRUTH TABLE
(1)
Mode
CS
CS
WE
WE
Output
Power
Standby
H
X
High-Z
Standby
Read
L
H
DATAOUT
Active
Write
L
L
High-Z
Active
NOTE:
2981 tbl 02
1. H = VIH, L = VIL, X = Don't Care.
CAPACITANCE (TA = +25
°C, f = 1.0MHz)
Symbol
Parameter
(1)
Conditions
Max. Unit
CIN
Input Capacitance
VIN = 0V
7
pF
COUT
Output Capacitance
VOUT = 0V
7
pF
NOTE:
2981 tbl 04
1. This parameter is determined by device characterization, but is not
production tested.
RECOMMENDED DC OPERATING
CONDITIONS
Symbol
Parameter
Min.
Typ.
Max. Unit
VCC
Supply Voltage
4.5
5.0
5.5
V
GND
Supply Voltage
0
0
0
V
VIH
Input High Voltage
2.2
—
6.0
V
VIL
Input Low Voltage
–0.5
(1)
—
0.8
V
NOTE:
2981 tbl 05
1. VIL (min.) = –3.0V for pulse width less than 20ns, once per cycle.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Rating
Com’l.
Mil.
Unit
VTERM
Terminal Voltage
–0.5 to +7.0
–0.5 to +7.0
V
with Respect
to GND
TA
Operating
0 to +70
–55 to +125
°C
Temperature
TBIAS
Temperature
–55 to +125
–65 to +135
°C
Under Bias
TSTG
Storage
–55 to +125
–65 to +150
°C
Temperature
PT
Power Dissipation
1.0
1.0
W
IOUT
DC Output
50
50
mA
Current
NOTE:
2981 tbl 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied.
Exposure to absolute maximum rating
conditions for extended periods may affect reliability.



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