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AN2266 Arkusz danych(PDF) 5 Page - STMicroelectronics

Numer części AN2266
Szczegółowy opis  SLIC based system protection for European and Asian markets
PDF  16 Pages
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Producent  STMICROELECTRONICS [STMicroelectronics]
Strona internetowa  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN2266 Arkusz danych(HTML) 5 Page - STMicroelectronics

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AN2266
LCP concept
16
Table 1 shows the most commonly used worldwide ESD standards. Generally, level 4 is
required.
Section 2 presents the protection concept used for SLICs on both short and long line
applications.
2
LCP concept
Figure 6. LCP152xx concept behavior
Figure 6 shows the classic protection circuit using the LCP152xx crowbar concept. This
topology has been developed to protect the new high voltage SLICs. It allows the system to
be programmed for the negative firing threshold while the positive clamping value is fixed at
GND.
When a negative surge occurs on one wire (L1 for example), a current Ig flows through the
base of the transistor T and then injects a current in the gate of the thyristor Th. Then Th
turns on and the whole surge current shunts to ground (GND). After the surge, when the
current flowing through Th becomes lower than the holding current value Ih, Th switches off.
Table 1. IEC61000-4-2 ESD surge standard
1a contact discharge
1b air discharge
Level
Test voltage (kV)
Level
Test voltage (kV)
12
12
24
24
36
38
48
4
15
X(1)
1.
“X” is a level to be defined
Special
X(1)
Special
L 1
L 2
Gate
-Vbat
C
T
TIP
RING
GND
Th
D
Rs1
Rs2
Ig
ID
V tip
V Ring
Line side



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