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AN2266 Arkusz danych(PDF) 5 Page - STMicroelectronics |
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AN2266 Arkusz danych(HTML) 5 Page - STMicroelectronics |
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5 / 16 page ![]() DocID11830 Rev 2 5/16 AN2266 LCP concept 16 Table 1 shows the most commonly used worldwide ESD standards. Generally, level 4 is required. Section 2 presents the protection concept used for SLICs on both short and long line applications. 2 LCP concept Figure 6. LCP152xx concept behavior Figure 6 shows the classic protection circuit using the LCP152xx crowbar concept. This topology has been developed to protect the new high voltage SLICs. It allows the system to be programmed for the negative firing threshold while the positive clamping value is fixed at GND. When a negative surge occurs on one wire (L1 for example), a current Ig flows through the base of the transistor T and then injects a current in the gate of the thyristor Th. Then Th turns on and the whole surge current shunts to ground (GND). After the surge, when the current flowing through Th becomes lower than the holding current value Ih, Th switches off. Table 1. IEC61000-4-2 ESD surge standard 1a contact discharge 1b air discharge Level Test voltage (kV) Level Test voltage (kV) 12 12 24 24 36 38 48 4 15 X(1) 1. “X” is a level to be defined Special X(1) Special L 1 L 2 Gate -Vbat C T TIP RING GND Th D Rs1 Rs2 Ig ID V tip V Ring Line side |
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