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AN4160 Arkusz danych(PDF) 13 Page - STMicroelectronics |
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AN4160 Arkusz danych(HTML) 13 Page - STMicroelectronics |
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13 / 14 page ![]() DocID023640 Rev 2 13/14 AN4160 Conclusions 14 5 Conclusions A detailed description of surge test setup, measurements, and results has been provided to verify compliance to international EMC standards. The analyzed coupling circuit topology proved well devised to protect the PLC device. The right TVS part numbers were found and accurately tested. Following these criteria to develop a PLC application will ensure reliability of the solution. 6 Revision history Table 5. Document revision history Date Revision Changes 15-Jan-2013 1 Initial release. 30-Jun-2014 2 Updated Figure 2, Figure 3 and Chapter 4.2. |
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