KAI−08050

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13

DEFECT DEFINITIONS

Table 9. OPERATION CONDITIONS FOR DEFECT TESTING AT 405C

Description

Condition

Notes

Operational Mode

Two outputs, using VOUTa and VOUTc, continuous readout

HCCD Clock Frequency

10 MHz

Pixels Per Line

3520

1

Lines Per Frame

1360

2

Line Time

354.9 msec

Frame Time

482.7 msec

Photodiode Integration Time

Mode A: PD_Tint = Frame Time = 482.7 msec, no electronic shutter used

Mode B: PD_Tint = 33 msec, electronic shutter used

VCCD Integration Time

447.2 msec

3

Temperature

40°C

Light Source

Continuous red, green and blue LED illumination

4

Operation

Nominal operating voltages and timing

1. Horizontal overclocking used.

2. Vertical overclocking used.

3. VCCD Integration Time = 1260 lines x Line Time, which is the total time a pixel will spend in the VCCD registers.

4. For monochrome sensor, only the green LED is used.

Table 10. DEFECT DEFINITIONS FOR TESTING AT 405C

Description

Definition

Standard Grade

Grade 2

Notes

Major dark field defective bright pixel

PD_Tint = Mode A → Defect ≥ 166 mV

or

PD_Tint = Mode B → Defect ≥ 12 mV

80

80

1

Major bright field defective dark pixel

Defect ≥ 12%

Minor dark field defective bright pixel

PD_Tint = Mode A → Defect ≥ 86 mV

or

PD_Tint = Mode B → Defect ≥ 6 mV

800

800

Cluster defect

A group of 2 to 10 contiguous major defective

pixels, but no more than 3 adjacent defects

horizontally.

15

n/a

2

Cluster defect (grade 2)

A group of 2 to 10 contiguous major defective

pixels

n/a

15

2

Column defect

A group of more than 10 contiguous major

defective pixels along a single column

0

0

2

1. For the color device (KAI−08050−CBA or KAI−08050−PBA), a bright field defective pixel deviates by 12% with respect to pixels of the same

color.

2. Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel defects).