FXLS8471Q datasheet(13/75 Pages) FREESCALE

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FXLS8471Q

Sensors

Freescale Semiconductor, Inc.

Device Characteristics

5.1

Mechanical characteristics

Table 2. Mechanical characteristics @ VDD = 2.5 V, VDDIO = 1.8 V T = 25°C unless otherwise noted.

Parameter

Test Conditions

Symbol

Min

Typ

Max

Unit

Measurement range(1)

1. Dynamic range is limited to ±4 g when in the low-noise mode.

±2 g mode

FSACC

±2

±4 g mode

±4

±8 g mode

±8

Sensitivity

±2 g mode

SENACC

4096

LSB/g

0.244

mg/LSB

±4 g mode

2048

LSB/g

0.488

mg/LSB

±8 g mode

1024

LSB/g

0.976

mg/LSB

Sensitivity change with temperature(1)

±2 g, ±4 g, ±8 g modes

TCSACC

±0.01

%/°C

Sensitivity accuracy

@ 25°C

SEN-TOLACC

±2.5

%SENACC

Zero-g level offset accuracy(2)

2. Before board mount.

±2 g, ±4 g, ±8 g modes

OFFACC

±20

Zero-g level offset accuracy post-board mount(3)

3. Post-board mount offset specifications are based on a 2-layer PCB design.

±2 g, ±4 g, ±8 g modes

OFF-PBMACC

±30

Zero-g level change versus temperature

-40°C to 85°C(1)

TCOACC

±0.2

mg/°C

Nonlinearity (deviation from straight line)(4)(5)

4. Evaluation only.

5. After post-board mount corrections for sensitivity, cross axis and offset. Refer to AN4399 for more information.

Over ±1 g range normal mode

NLACC

±0.5

%FSACC

Self-Test output change(6)

6. Self-test is only exercised along one direction for each sensitive axis.

Set to ±2 g mode

STOCACC

+192

+270

+1275

LSB

Output noise density(4)(7)

7. Measured using earth's gravitational field (1 g) with the device oriented horizontally (+Z axis up) and stationary.

ODR = 400 Hz, normal mode

NDACC-NM

126

µg/

√Hz

ODR = 400 Hz, low-noise mode(1)

NDACC-LNM

µg/

√Hz

Operating temperature range

Top

-40

+85

°C

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