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REF5050MDREP Arkusz danych(PDF) 3 Page - Texas Instruments

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Numer części REF5050MDREP
Szczegółowy opis  Low-Noise, Very Low Drift, Precision Voltage Reference
PDF  29 Pages
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Producent  TI1 [Texas Instruments]
Strona internetowa  http://www.ti.com
Logo TI1 - Texas Instruments

REF5050MDREP Arkusz danych(HTML) 3 Page - Texas Instruments

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DNC
(1)
NC
(2)
TRIM/NR
DNC
(1)
V
IN
TEMP
GND
V
OUT
REF50xx
(1) DNC = Do not connect.
(2) NC = No internal connection.
NOTES:
REF5020-EP, REF5025-EP, REF5040-EP, REF5050-EP
www.ti.com
SBOS471B – APRIL 2010 – REVISED JUNE 2015
5 Pin Configuration and Functions
D Package
8- Pin SOIC
Top View
Pin Functions
PIN
I/O
DESCRIPTION
NAME
NO.
DNC
1
—
Do not connect
Power supply voltage. Range from VOUT + 0.2 V up to 18 V. Recommended bypass
VIN
2
Power
capacitor from 1 µF up to 10 µF
TEMP
3
O
Temperature monitoring pin provides a temperature-dependent voltage output
GND
4
Power
System ground
Output adjustment and noise reduction input. Connecting 1 µF to this pin will create low pas
TRIM/NR
5
I
filter at the bandgap and reduce output noise
Very accurate, factory-trimmed voltage output. Recommended bypass capacitor from 1 µF
VOUT
6
O
up to 50 µF with ESR between 1 and 1.5
Ω
NC
7
—
No internal connection
DNC
8
—
Do not connect
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
Input voltage
VIN
18
V
Output short-circuit
30
mA
Operating temperature
–55
125
°C
Junction temperature, TJ
150
°C
Storage temperature, Tstg
–65
150
°C
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
6.2 ESD Ratings
VALUE
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±3000
V(ESD)
Electrostatic discharge
V
Charged-device model (CDM), per JEDEC specification JESD22-
±1000
C101(2)
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 2010–2015, Texas Instruments Incorporated
Submit Documentation Feedback
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Product Folder Links: REF5020-EP REF5025-EP REF5040-EP REF5050-EP



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