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STF28N60DM2 Arkusz danych(PDF) 8 Page - STMicroelectronics |
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STF28N60DM2 Arkusz danych(HTML) 8 Page - STMicroelectronics |
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8 / 12 page ![]() Test circuits STF28N60DM2 8/12 DocID026863 Rev 2 3 Test circuits Figure 14: Test circuit for resistive load switching times Figure 15: Test circuit for gate charge behavior Figure 16: Test circuit for inductive load switching and diode recovery times Figure 17: Unclamped inductive load test circuit Figure 18: Unclamped inductive waveform Figure 19: Switching time waveform |
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