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PI3B3245LE Arkusz danych(PDF) 2 Page - Pericom Semiconductor Corporation

Numer części PI3B3245LE
Szczegółowy opis  3.3V, Hot Insertion, 8-Bit, 2-Port NanoSwitch
PDF  5 Pages
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Producent  PERICOM [Pericom Semiconductor Corporation]
Strona internetowa  http://www.pericom.com
Logo PERICOM - Pericom Semiconductor Corporation

PI3B3245LE Arkusz danych(HTML) 2 Page - Pericom Semiconductor Corporation

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PS8162i
12/08/10
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PI3B3245
3.3V, Hot Insertion, 8-Bit, 2-Port NanoSwitchTM
Absolute Maximum Ratings
Parameter
Min.
Max.
Units
Storage Temperature
-65
150
o
C
Ambient Temperature with Power Applied
-40
85
o
C
Supply Voltage to Ground Potential
-0.5
4.6
V
DC Input Voltage
-0.5
4.6
V
DC Output Current
-
120
mA
Power Dissipation
-
0.5
W
Stress beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
DC Electrical Characteristics (Over the Operating Range, TA = –40°C to +85°C, VCC = 3.3V ±10%)
Parameters Description
Test Conditions(1)
Min
Typ (2)
Max
Units
VIH
Input HIGH Voltage
Guaranteed Logic HIGH Level
2.0
V
VIL
Input LOW Voltage
Guaranteed Logic LOW Level
-0.5
0.8
V
IIH
Input HIGH Current
VCC = Max., VIN = VCC
±1
μA
IIL
Input LOW Current
VCC = Max., VIN = GND
±1
μA
IOZH
High Impedance Output Current 0 ≤ AN, BN ≤ VCC
±1
μA
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18 mA
-1.2
V
RON
Switch On Resistance(3)
VCC = Min., VIN = 0.0V, ION = 48mA
or 64mA
5
8
Ω
VCC = Min, VIN = 2.4V, ION = 15mA
10
17
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 3.3V, TA = 25°C ambient and maximum loading.
3. Measured by the voltage drop between A and B pin at indicated current through the switch. ON resistance is determined by the lower of the voltages on the two
(A,B) pins.
Capacitance (TA = 25°C, f = 1 MHz)
Parameters(1) Description
Test Conditions
Typ
Units
CIN
Input Capacitance
VIN = 0V
3.0
pF
COFF
A/B Capacitance, Switch Off
VIN = 0V
8.0
pF
CON
A/B Capacitance, Switch On
VIN = 0V
16.0
pF
Notes:
1. This parameter is determined by device characterization but is not production tested.
10-0247



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