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CLC5957PCASM Arkusz danych(PDF) 8 Page - National Semiconductor (TI) |
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CLC5957PCASM Arkusz danych(HTML) 8 Page - National Semiconductor (TI) |
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8 / 12 page ![]() http://www.national.com 8 Figures 5 and 6 show the clock interface schemes to several other types of clock sources. Figure 5: 5V CMOS Level Clock Scheme Figure 6: TTL or 3V CMOS Level Clock Scheme Digital Outputs and Level Select Figure 7 depicts the digital output buffer and bias used in the CLC5957. Although each of the twelve output bits uses a controlled current buffer to limit supply transients, it is recommended that parasitic loading of the outputs is minimized. Because these output transients are harmoni- cally related to the analog input signal, excessive loading will degrade ADC performance at some frequencies. Figure 7: CLC5957 Digital Outputs The logic high level is slaved to the internal 2.4 voltage reference. The OUTLEV control pin selects either a 3.3V or 2.5V logic high level. An internal pullup resistor selects the 3.3 volt level as the default when the OUTLEV pin is left open. Grounding the OUTLEV pin selects the 2.5V logic high level. To ease user interface to subsequent digital circuitry, the CLC5957 has a data valid clock output (DAV). In order to match delays over IC processing variables, this digital output also uses the same output buffer as the data bits. The DAV clock output is simply a delayed version of the ENCODE input clock. Since the ADC output data change is slaved to the falling edge of the ENCODE clock, the rising DAV clock edge occurs near the center of the data valid window (or eye) regardless of the sampling frequency. ENC CLC5957 0.01 µF ENC ENC CLC5957 0.01 µF ENC 2.4Vref GNDD Digital Signal VCCD Controlled Current Output Buffer Digital Output Output Level Open = 3.3Vhi GND = 2.5Vhi CML to CMOS + - + - 10k Ω 50 Ω |
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