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LP8501 Arkusz danych(PDF) 5 Page - Texas Instruments |
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LP8501 Arkusz danych(HTML) 5 Page - Texas Instruments |
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5 / 51 page ![]() LP8501 www.ti.com SNVS548D – SEPTEMBER 2008 – REVISED AUGUST 2013 PIN DESCRIPTIONS(1) Pin Name Type Description A1 D1 A Current source output 1 A2 D2 A Current source output 2 A3 VOUT A Charge pump output A4 C2- A Flying capacitor 2 negative terminal A5 C2+ A Flying capacitor 2 positive terminal B1 D3 A Current source output 3 B2 D4 A Current source output 4 B3 VDD1_6 P Power for D1 to D6 drivers B4 C1- A Flying capacitor 1 negative terminal B5 C1+ A Flying capacitor 1 positive terminal C1 D5 A Current source output 5 C2 D6 A Current source output 6 C3 VDD7_9 P Power for D7 to D9 drivers C4 EN I Enable C5 VDD P Input power supply D1 D7 A Current source output 7. D2 D8 A Current source output 8. D3 INT OD/O Interrupt for microcontroller unit. Leave unconnected if not used D4 CLK I 32 kHz clock input; connect to ground if not used. D5 GND G Ground E1 D9 A Current source output 9. E2 GPO O General purpose output. Leave unconnected if not used. E3 TRIG I/OD Trigger; connect to ground if not used. E4 SDA I/OD Serial interface data E5 SCL I Serial interface clock (1) A: Analog Pin, G: Ground Pin, P: Power Pin, I: Input Pin, I/O Input/Output Pin, O: Output Pin, OD: Open Drain Pin This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. Copyright © 2008–2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LP8501 |
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