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MICRF112 Arkusz danych(PDF) 4 Page - Micrel Semiconductor |
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MICRF112 Arkusz danych(HTML) 4 Page - Micrel Semiconductor |
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4 / 21 page ![]() Micrel, Inc. MICRF112 February 2013 4 M9999-020713 Parameter Condition Min. Typ. Max. Units Digital/Control Section Output Blanking STDBY transition from low to high 500 µs Digital Input (EN, ASK, and FSK) High (VIH) 0.8 × VDD V Low (VIL) 0.2 × VDD V Digital Input Leakage Current (EN, ASK, and FSK Pins) High (VIH) 0.05 µA Low (VIL) 0.05 µA Undervoltage Lock Out (UVLO) 1.6 V Notes: 1. Exceeding the absolute maximum rating may damage the device. 2. The device is not guaranteed to function outside its operating ratings. 3. Devices are ESD sensitive. Handling precautions recommended. Human body model, 1.5k in series with 100pF. 4. Measured using the circuit shown in the “Test Circuit” section. 5. RBW = 100kHz, OBW measured at −20dBc. 6. Dependent on crystal. |
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