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LM2467T Arkusz danych(PDF) 3 Page - National Semiconductor (TI) |
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LM2467T Arkusz danych(HTML) 3 Page - National Semiconductor (TI) |
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3 / 12 page ![]() AC Test Circuit Figure 2 shows a typical test circuit for evaluation of the LM2467. This circuit is designed to allow testing of the LM2467 in a 50 Ω environment without the use of an expensive FET probe. The two 2490 Ω resistors form a 200:1 divider with the 50Ω resistor and the oscilloscope. A test point is included for easy use of an oscilloscope probe.The compensation capacitor is used to compensate the stray capacitance of the two 2490 Ω resistors to achieve flat frequency response. DS200078-3 Note: 8 pF load includes parasitic capacitance. FIGURE 2. Test Circuit (One Channel) www.national.com 3 |
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