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XT40.482 Arkusz danych(PDF) 9 Page - PULS GmbH

Numer części XT40.482
Szczegółowy opis  THREE-PHASE INPUT
PDF  20 Pages
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Producent  PULS [PULS GmbH]
Strona internetowa  http://www.pulspower.com/
Logo PULS - PULS GmbH

XT40.482 Arkusz danych(HTML) 9 Page - PULS GmbH

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XT40.481, XT40.482
– X-Series
48V, 20A, THREE-PHASE INPUT
Jan. 2007 / Rev. 1.0 DS-XT40.48x-EN All parameters are specified at 48V 20A, 3x400Vac (XT40.481) or 3x480Vac (XT40.482),
25°C ambient and after a 5 minutes run-in time unless otherwise noted.
www.pulspower.com Phone +49 89 9278 0
Germany
9/20
12. TERMINALS AND WIRING
Use appropriate copper cables that are designed for a minimum operating temperatures of 60°C (for ambient up to
45°C) and 75°C (for ambient up to 60°C). Follow national installation codes and regulations! Ensure that all strands of
a stranded wire enter the terminal connection! Do not use the power supply without PE (Ground) connection! Up to
two stranded wires with the same cross section are permitted in one connection point (except PE wire). Ferrules are
allowed, but not required.
Input
Output
Type
Screw terminal
Screw terminal
Solid wire
0.5-6mm
2
0.5-16mm
2
Stranded wire
0.5-4mm
2
0.5-10mm
2
American wire gauge
20-10 AWG
22-8 AWG
Wire stripping length
7mm / 0.26inch
12mm / 0.5inch
Recommended tightening torque
0.8Nm / 7lb.inch
1.2Nm / 10.6lb.inch
13. RELIABILITY
Lifetime expectancy
min.
77 000h
40°C, 20A
min.
> 15 years
40°C, 10A
min.
> 15 years
25°C, 20A
MTBF SN 29500, IEC 61709
541 000h
40°C, 20A
978 000h
25°C, 20A
MTBF MIL HDBK 217F
199 000h
40°C, 20A, Ground Benign GB40
267 000h
25°C, 20A, Ground Benign GB25
The Lifetime expectancy shown in the table above indicates the operating hours (service life) and is determined by
the lifetime expectancy of the built-in electrolytic capacitors.
Lifetime expectancy is specified in operational hours and is calculated according to the capacitor’s manufacturer
specification. The prediction model allows a calculation of up to 15 years from date of shipment.
MTBF stands for Mean Time Between Failure, which is calculated according to statistical device failures, and indicates
reliability of a device. It is the statistical representation of the likelihood of a unit to fail and does not necessarily
represent the life of a product.



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