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STP18N65M2 Arkusz danych(PDF) 8 Page - STMicroelectronics |
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STP18N65M2 Arkusz danych(HTML) 8 Page - STMicroelectronics |
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8 / 15 page ![]() Test circuits STI18N65M2, STP18N65M2 8/15 DocID026870 Rev 2 3 Test circuits Figure 14. Switching times test circuit for resistive load Figure 15. Gate charge test circuit Figure 16. Test circuit for inductive load switching and diode recovery times Figure 17. Unclamped inductive load test circuit Figure 18. Unclamped inductive waveform Figure 19. Switching time waveform AM01468v1 VGS PW VD RG RL D.U.T. 2200 μF 3.3 μF VDD AM01470v1 A D D.U.T. S B G 25 Ω A A B B RG G FAST DIODE D S L=100 μH μF 3.3 1000 μF VDD AM01471v1 Vi Pw VD ID D.U.T. L 2200 μF 3.3 μF VDD |
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