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STM32F101XF Arkusz danych(PDF) 22 Page - STMicroelectronics

Numer części STM32F101XF
Szczegółowy opis  Single-cycle multiplication and hardware division
PDF  117 Pages
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Producent  STMICROELECTRONICS [STMicroelectronics]
Strona internetowa  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F101XF Arkusz danych(HTML) 22 Page - STMicroelectronics

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Description
STM32F101xF, STM32F101xG
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DocID16553 Rev 5
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start trigger and injection trigger, respectively, to allow the application to
synchronize A/D conversion and timers.
2.3.24
DAC (digital-to-analog converter)
The two 12-bit buffered DAC channels can be used to convert two digital signals into two
analog voltage signal outputs. The chosen design structure is composed of integrated
resistor strings and an amplifier in inverting configuration.
This dual digital Interface supports the following features:
two DAC converters: one for each output channel
8-bit or 12-bit monotonic output
left or right data alignment in 12-bit mode
synchronized update capability
noise-wave generation
triangular-wave generation
dual DAC channel independent or simultaneous conversions
DMA capability for each channel
external triggers for conversion
input voltage reference VREF+
Seven DAC trigger inputs are used in the STM32F101xF and STM32F101xG access line
family. The DAC channels are triggered through the timer update outputs that are also
connected to different DMA channels.
2.3.25
Temperature sensor
The temperature sensor has to generate a voltage that varies linearly with temperature. The
conversion range is between 2 V < VDDA < 3.6 V. The temperature sensor is internally
connected to the ADC_IN16 input channel which is used to convert the sensor output
voltage into a digital value.
2.3.26
Serial wire JTAG debug port (SWJ-DP)
The ARM® SWJ-DP Interface is embedded, and is a combined JTAG and serial wire debug
port that enables either a serial wire debug or a JTAG probe to be connected to the target.
The JTAG TMS and TCK pins are shared respectively with SWDIO and SWCLK and a
specific sequence on the TMS pin is used to switch between JTAG-DP and SW-DP.
2.3.27
Embedded Trace Macrocell™
The ARM® Embedded Trace Macrocell provides a greater visibility of the instruction and
data flow inside the CPU core by streaming compressed data at a very high rate from the
STM32F10xxx through a small number of ETM pins to an external hardware trace port
analyzer (TPA) device. The TPA is connected to a host computer using Ethernet, or any
other high-speed channel. Real-time instruction and data flow activity can be recorded and
then formatted for display on the host computer running debugger software. TPA hardware
is commercially available from common development tool vendors. It operates with third
party debugger software tools.



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