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S29AS008J Arkusz danych(PDF) 43 Page - Cypress Semiconductor |
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S29AS008J Arkusz danych(HTML) 43 Page - Cypress Semiconductor |
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43 / 56 page ![]() Document Number: 002-00870 Rev.*K Page 43 of 56 S29AS008J 18.2 Hardware Reset (RESET#) Note Not 100% tested. Figure 18.2 RESET# Timings Note 1. CE# should only go low after RESET# has gone high. Keeping CE# low from power-up through the first read could cause the first read to retrieve erroneous data. Parameter Description All Speed Options JEDEC Std Test Setup Unit tREADY RESET# Pin Low (During Embedded Algorithms) to Read or Write (See Note) Max 35 µs tREADY RESET# Pin Low (NOT During Embedded Algorithms) to Read or Write (See Note) Max 500 ns tRP RESET# Pulse Width Min 500 tRH RESET# High Time Before Read (See Note) 50 tRPD RESET# Low to Standby Mode 20 µs tRB RY/BY# Recovery Time 0 ns RESET# RY/BY# RY/BY# tRP tReady Reset Timings NOT during Embedded Algorithms (Note 1) tReady CE#, OE# tRH CE#, OE# Reset Timings during Embedded Algorithms RESET# tRP tRB |
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