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AD8375ACPZ-R7 Arkusz danych(PDF) 17 Page - Analog Devices |
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AD8375ACPZ-R7 Arkusz danych(HTML) 17 Page - Analog Devices |
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17 / 24 page ![]() Data Sheet AD8375 Rev. B | Page 17 of 24 LAYOUT CONSIDERATIONS There are two output pins for each polarity, and they are oriented in an alternating fashion. When designing the board, care should be taken to minimize the parasitic capacitance due to the routing that connects the corresponding outputs together. A good practice is to avoid any ground or power plane under this routing region and under the chokes to minimize the parasitic capacitance. CHARACTERIZATION TEST CIRCUITS Differential-to-Differential Characterization The S-parameter characterization for the AD8375 was performed using a dedicated differential input to differential output characterization board. Figure 44 shows the layout of characterization board. The board was designed for optimum impedance matching into a 75 Ω system. Because both the input and output impedances of the AD8375 are 150 Ω differentially, 75 Ω impedance runs were used to match 75 Ω network analyzer port impedances. On-board 1 μH inductors were used for output biasing, and the output board traces were designed for minimum capacitance. 0.1µF 0.1µF L1 1µH L2 1µH 0.1µF 0.1µF +5V 5 A0 TO A4 AC 75 Ω TRACES 75 Ω TRACES 75 Ω 75 Ω 75 Ω 75 Ω AC AD8375 Figure 42. Test Circuit for S-Parameters on Dedicated 75 Ω Differential-to-Differential Board 0.1µF 0.1µF TC3-1T T1 0.1µF 0.1µF 330 Ω 330 Ω 25 Ω 25 Ω 50 Ω +9V 5 A0 TO A4 50 Ω 96 Ω 96 Ω AC AD8375 Figure 43. Test Circuit for Time Domain Measurements Figure 44. Differential-to-Differential Characterization Board Circuit Side Layout C1 0.1µF C2 0.1µF TC3-1T AD8375 T1 L1 1µH L2 1µH C3 0.1µF C4 0.1µF R1 62 Ω R2 62 Ω R4 25 Ω R3 25 Ω ETC1-1-13 T2 50 Ω PAD LOSS = 11dB +5V 5 A0 TO A4 50 Ω AC Figure 45. Test Circuit for Distortion, Gain, and Noise |
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