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AD8194ACPZ-R7 Arkusz danych(PDF) 4 Page - Analog Devices |
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AD8194ACPZ-R7 Arkusz danych(HTML) 4 Page - Analog Devices |
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4 / 16 page ![]() AD8194 Data Sheet Rev. A | Page 4 of 16 ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Rating AVCC to AVEE 3.7 V VTTI AVCC + 0.6 V VTTO AVCC + 0.6 V Internal Power Dissipation 1.2 W High Speed Input Voltage AVCC − 1.4 V < VIN < AVCC + 0.6 V High Speed Differential Input Voltage 2.0 V Source Select (S_SEL) AVEE − 0.3 V < VIN < AVCC + 0.6 V Storage Temperature Range −65°C to +125°C Operating Temperature Range −40°C to +85°C Junction Temperature 150°C Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability. THERMAL RESISTANCE θJA is specified for the worst-case conditions: a device soldered in a 4-layer JEDEC circuit board for surface-mount packages. θJC is specified for the exposed pad soldered to the circuit board with no airflow. Table 3. Thermal Resistance Package Type θJA θJC Unit 32-Lead LFCSP 47 6.8 °C/W MAXIMUM POWER DISSIPATION The maximum power that can be safely dissipated by the AD8194 is limited by the associated rise in junction tempera- ture. The maximum safe junction temperature for plastic encapsulated devices is determined by the glass transition temperature of the plastic, approximately 150°C. Temporarily exceeding this limit may cause a shift in parametric performance due to a change in the stresses exerted on the die by the package. Exceeding a junction temperature of 175°C for an extended period can result in device failure. To ensure proper operation, it is necessary to observe the maximum power derating as determined by the coefficients in Table 3. ESD CAUTION |
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