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RA32E1-RUT-FR Arkusz danych(PDF) 13 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
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RA32E1-RUT-FR Arkusz danych(HTML) 13 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
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13 / 20 page ![]() Tel: +86-755-66839118 Fax:+86-755-66839300 E-mail:uvsales@refond.com W eb: www.refonduv.com PAGE:13 REFOND:WI-E-045 A/3 REV:E/3 TG-201709070731NP 2.5 Criteria For Judging Damage Table 2-4 Criteria For Judging Damage Test Items Symbol Test Condition Criteria For Judgement Min. Max. Forward Voltage VF IF=100mA - U.S.L*)x1.1 Reverse Current IR VR = 5V - U.S.L*)x2.0 Total radiant flux Фe IF=100mA L.S.L*)x0.7 - Notes 1.U.S.L: Upper standard level L.S.L: Lower standard level 2. The above reliability tests is based on the verification of a single/strip LED of Refond's existing experimental platform, the reliability experiment was taken under good heat dissipation conditions. when customers applies the LED to the series and parallel circuit, should take consideration of all the factors such as the current, voltage distribution, heat dissipation and others. 3.The technical information shown in the data sheets is limited to the typical characteristics and circuit examples of the referenced products. It does not constitute the warranting of industrial property nor the granting of any license. |
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