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B7NE65 Arkusz danych(PDF) 6 Page - Jiangsu Donghai Semiconductor Technology Co.,Ltd |
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B7NE65 Arkusz danych(HTML) 6 Page - Jiangsu Donghai Semiconductor Technology Co.,Ltd |
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6 / 11 page ![]() ROUM Semiconductor Technology CO.,LTD. Rev. 1.0 www.roum.cn Page 6 of 11 B7NE65 6 Typical Test Circuit and Waveform 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 A B C D 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 D C B A Title N u mb er R ev is io n Size E D ate: 2 5 -M ay -2 0 1 7 Sh eet o f File: C :\ U s ers \A dm in is trat or \D es k to p \ 模板\w x d hq x t ( 1) . d db D raw n B y : Same Type 50KΩ DUT V DS 200nF V 12V 200nF is DUT GS V GS 10V Q gs Q gd Q g V DS R L V DD DUT V GS R G 10V V DS 90% 10% V GS td(on) tr td(off) tf I D di/dt=100A/μA Q trr rr di/dt adj. Double Pulse D.U.T I L Current Pump V DD D 1) Gate Charge Test Circuit & Waveform 2) Resistive Switching Test Circuit & Waveforms 3) Diode Reverse Recovery Test Circuit & Waveform |
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