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FSUSB242 Arkusz danych(PDF) 10 Page - ON Semiconductor |
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FSUSB242 Arkusz danych(HTML) 10 Page - ON Semiconductor |
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10 / 12 page ![]() FSUSB242UCX−Z002 www.onsemi.com 10 TEST DIAGRAMS (Continued) Figure 15. Break−Before−Make Interval Timing Figure 16. Bandwidth Figure 17. Channel Off Isolation Figure 18. Non-Adjacent Channel-to-Channel Crosstalk Vcc 0.9*Vout Vcc/2 tBBM 0V VOUT Input− VSel 0.9*Vout tRISE= 2.5ns 90% 10% CL HSDn RL Dn GND GND RS VSel V SW1 GND VOUT V SW2 GND −− RL, RS, and CL are functions of the application environment (see AC Tables for specific values) CL includes test fixture and stray capacitance. VOUT GND GND RT GND GND VS RS Network Analyzer VSel GND RS and RT are functions of the application environment (see AC Tables for specific values). VIN RS and RT are functions of the application environment (see AC Tables for specific values). VOUT GND GND RT GND GND VS RS Network Analyzer RT GND VSel GND VIN RT Off isolation = 20 Log (VOUT / VIN) VOUT GND GND RT GND GND VS RS Network Analyzer RT GND RS and RT are functions of the application environment (see AC Tables for specific values). VSel GND NC VIN Crosstalk = 20 Log (VOUT / VIN) |
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