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S25FL128SDPNFAQ Arkusz danych(PDF) 29 Page - Cypress Semiconductor |
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S25FL128SDPNFAQ Arkusz danych(HTML) 29 Page - Cypress Semiconductor |
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29 / 149 page ![]() Document Number: 001-98283 Rev. *M Page 28 of 148 S25FL128S/S25FL256S 5. Timing Specifications 5.1 Key to Switching Waveforms Figure 23. Waveform Element Meanings Figure 24. Input, Output, and Timing Reference Levels 5.2 AC Test Conditions Figure 25. Test Setup Notes: 1. Output High-Z is defined as the point where data is no longer driven. 2. Input slew rate: 1.5 V/ns. 3. AC characteristics tables assume clock and data signals have the same slew rate (slope). 4. DDR Operation. Table 9. AC Measurement Conditions Symbol Parameter Min Max Unit CL Load Capacitance 30 15 (4) pF Input Rise and Fall Times 2.4 ns Input Pulse Voltage 0.2 x VIO to 0.8 VIO V Input Timing Ref Voltage 0.5 VIO V Output Timing Ref Voltage 0.5 VIO V Input Symbol Output Valid at logic high or low Valid at logic high or low High Impedance Any change permitted Logic high Logic low Valid at logic high or low Valid at logic high or low High Impedance Changing, state unknown Logic high Logic low VIO + 0.4V 0.7 x VIO 0.2 x VIO - 0.5V Timing Reference Level 0.5 x VIO 0.85 x VIO 0.15 x VIO Input Levels Output Levels Device Under Test CL |
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