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TSC2007IPW Arkusz danych(PDF) 3 Page - Texas Instruments

Numer części TSC2007IPW
Szczegółowy opis  1.2V to 3.6V, 12-Bit, Nanopower, 4-Wire Micro TOUCH SCREEN CONTROLLER with I2C™ Interface
PDF  43 Pages
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Producent  TI2 [Texas Instruments]
Strona internetowa  https://www.ti.com
Logo TI2 - Texas Instruments

TSC2007IPW Arkusz danych(HTML) 3 Page - Texas Instruments

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ELECTRICAL CHARACTERISTICS
TSC2007
www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009
At TA = –40°C to +85°C, VDD = +1.2V to +3.6V, unless otherwise noted.
TSC2007
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
AUXILIARY ANALOG INPUT
Input voltage range
0
VDD
V
Input capacitance
12
pF
Input leakage current
–1
+1
µA
A/D CONVERTER
Resolution
Programmable: 8 or 12 bits
12
Bits
No missing codes
12-bit resolution
11
Bits
Integral linearity
±1.5
LSB(1)
VDD = 1.8V
–1.2
LSB
Offset error
VDD = 3.0V
–3.1
LSB
VDD = 1.8V
0.7
LSB
Gain error
VDD = 3.0V
0.1
LSB
TOUCH SENSORS
TA = +25°C, VDD = 1.8V, command '1011' set '0000'
51
k
PENIRQ pull-up resistor, RIRQ
TA = +25°C, VDD = 1.8V, command '1011' set '0001'
90
k
Y+, X+
6
Switch
on-resistance
Y–, X–
5
Switch drivers drive current(2)
100ms duration
50
mA
INTERNAL TEMPERATURE SENSOR
Temperature range
–40
+85
°C
VDD = 3V
1.94
°C/LSB
Differential
method(3)
VDD = 1.6V
1.04
°C/LSB
Resolution
VDD = 3V
0.35
°C/LSB
TEMP1(4)
VDD = 1.6V
0.19
°C/LSB
VDD = 3V
±2
°C/LSB
Differential
method(3)
VDD = 1.6V
±2
°C/LSB
Accuracy
VDD = 3V
±3
°C/LSB
TEMP1(4)
VDD = 1.6V
±3
°C/LSB
INTERNAL OSCILLATOR
VDD = 1.2V
3.19
MHz
VDD = 1.8V
3.66
MHz
8-Bit
VDD = 2.7V
3.78
MHz
VDD = 3.6V
3.82
MHz
Internal clock frequency, fCCLK
VDD = 1.2V
1.6
MHz
VDD = 1.8V
1.83
MHz
12-Bit
VDD = 2.7V
1.88
MHz
VDD = 3.6V
1.91
MHz
VDD = 1.6V
0.0056
%/°C
Frequency drift
VDD = 3.0V
0.012
%/°C
(1)
LSB means Least Significant Bit. With VDD/REF pin = +1.6V, one LSB is 391
µV.
(2)
Specified by design, but not tested. Exceeding 50mA source current may result in device degradation.
(3)
Difference between TEMP1 and TEMP2 measurement; no calibration necessary.
(4)
Temperature drift is –2.1mV/°C.
Copyright © 2007–2009, Texas Instruments Incorporated
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