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L9347 Arkusz danych(PDF) 19 Page - STMicroelectronics |
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L9347 Arkusz danych(HTML) 19 Page - STMicroelectronics |
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19 / 29 page ![]() L9347 Functional Description 19/29 Clock failure (clock loss) (1) L L L L L L H H L H/PWM L H/PWM OFF OFF OFF OFF H H H L Drift (2) Failure No failure H H H H L L H H L H/PWM H/PWM H/PWM OFF OFF ON ON X X L H 1. During power on sequence only detected on channel 3 and 4 (see description). 2. This input combination is also used for an internal chip-test and must not be used. Table 9. Diagnostic table (continued) Operating Condition Test Input TEST Enable Input ENA Control Input non- reg./reg. IN Power Output/Curr ent reg. Q Status Output ST |
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