6.6 Electrical Characteristics: LM50HV

LM50HV : +VS = 3V to 36V (DC) and no ILOAD, TA = -40°C to 150°C (unless otherwise noted); Typical specifications are at TA

= 25°C and +VS = 5V (unless otherwise noted)(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

SENSOR ACCURACY

TACY

Temperature accuracy(2)

TA = 25°C

LM50HV

±1

°C

TA = 20°C to 70°C

-2

2

TA = -10°C to 125°C

-2.5

2.5

TA = -40°C to 125°C

-3.5

3.5

TA = -20°C to 150°C,

3.1V ≤ +VS

-3

3

TA = -40°C to 150°C

-3.5

3.5

SENSOR OUTPUT

V0°C

Output voltage offset at 0°C

500

mV

TC

Temperature coefficient

(sensor gain)

TA = -40°C to 150°C

9.7

10

10.3

mV/°C

VONL

Output Nonlinearity(3)

TA = -40°C to 150°C

-1.2

1.2

°C

ZOUT

Output impedance

TA = -40°C to 150°C

2000

4000

Ω

TON

Turn-On Time

TA = 25°C, No CLoad, tr = 1µs of +VS step

40

µs

TLTD

Long-term stability and drift(4) TJ = 150°C for 300 hours

±0.25

°C

CLOAD

Capacitive load drive

RI = 0Ω

1

µF

tRESP_L

Response time (Stirred

Liquid)

τ = 63% for step response

(0.5in × 0.5in, 2-layer 62-

mil PCB)

From 22°C to 100°C

1.7

s

tRESP_A

Response time (Still Air)

From 18°C to 100°C

15.6

POWER SUPPLY

IDD

Operating current

TA = -40°C to 150°C

3V ≤ +VS ≤ 36V

52

130

μA

IOUT-SC

Output short-circuit current

limit

VO short-circuit source current

1

mA

PSR

Line regulation(5)

TA = -40°C to 150°C

3V ≤ +VS ≤ 36V

-0.6

0.6

mV/V

PSRR

Power supply rejection ratio

TA = 25°C

+VS = 3.3V, 5V and 12V

f = 1MHz

-25

dB

f = 100kHz

-40

ΔIDD

Change of quiescent current

TA = -40°C to 150°C

3V ≤ +VS ≤ 36V

30

μA

IDD_TEMP

Temperature coefficient of

quiescent current

TA = -40°C to 150°C

3V ≤ +VS ≤ 36V

0.3

μA/°C

VON-TH

Turn-on threshold voltage

TA = -40°C to 150°C

2.1

2.8

V

VOFF-TH

Temperature coefficient of

quiescent current

TA = -40°C to 150°C

1.7

2.1

V

(1)

Limits are specified to TI's AOQL (Average Outgoing Quality Level).

(2)

Accuracy is defined as the error between the output voltage and 10mv/°C multiplied by case temperature of the device plus 500mV, at

specified conditions of voltage, current, and temperature (expressed in °C).

(3)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated

temperature range of the device.

(4)

Long term stability and drift is determined using accelerated operational life testing at a junction temperature of 150°C.

(5)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

www.ti.com

LM50, LM50HV

SNIS118I – JULY 1999 – REVISED OCTOBER 2025

Copyright © 2025 Texas Instruments Incorporated

Submit Document Feedback

7

Product Folder Links: LM50 LM50HV