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L3234 Arkusz danych(PDF) 7 Page - STMicroelectronics |
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L3234 Arkusz danych(HTML) 7 Page - STMicroelectronics |
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7 / 26 page ![]() Figure 5: Test Circuit Data Transmission Interference Test Figure 4: Dynamic Features of L3234 DATA TRANSMISSION INTERFERENCE TEST The L3234 meet the requirements of the technical specification ST/PAA/TPA/STP/1063 from the CNET. The test circuit used is indicated below. The measured error rate for data transmission is lower than 10 -6 during the ringing phase. This test measures if during the ringing phase the circuit induce any noise to the closer lines. L3234 - L3235 7/26 |
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