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R3111Q552B Arkusz danych(PDF) 15 Page - Nisshinbo Micro Devices Inc. |
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R3111Q552B Arkusz danych(HTML) 15 Page - Nisshinbo Micro Devices Inc. |
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15 / 43 page ![]() R3111x 15 R3111E (TO-92) is the discontinued product as of April, 2017. TEST CIRCUITS GND VDD VIN ISS R3111x Series OUT GND VDD VIN R3111x Series OUT 470k 5V VOUT Supply Current Test Circuit Detector Threshold Test Circuit (Pull-up circuit is not necessary for CMOS Output type.) GND VDD VIN R3111x Series OUT VDS IOUT GND VDD VIN R3111x Series OUT VDD VDS IOUT VDS Nch Driver Output Current Test Circuit Pch Driver Output Current Test Circuit Apply to CMOS Output type only GND VDD R3111x Series OUT VDS VOUT 5V ROUT 470k P.G. +VDET+2.0V 0.7V GND COUT GND VDD R3111x Series OUT VDS VOUT 5V ROUT 470k P.G. +VDET+2.0V 0.7V GND RIN 470k CIN Output Delay Time Test Circuit (1) Output Delay Time Test Circuit (2) (Pull-up circuit is not necessary for CMOS Output type.) |
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