| Zakładka z wyszukiwarką danych komponentów |
|
LIS302DL Arkusz danych(PDF) 15 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
LIS302DL Arkusz danych(HTML) 15 Page - STMicroelectronics |
|
15 / 42 page ![]() LIS302DL Mechanical and electrical specifications 15/42 2.5.2 Zero-g level Zero-g level Offset (Off) describes the deviation of an actual output signal from the ideal output signal if there is no acceleration present. A sensor in a steady state on a horizontal surface will measure 0g in X axis and 0g in Y axis whereas the Z axis will measure 1g. The output is ideally in the middle of the dynamic range of the sensor (content of OUT registers 00h, data expressed as 2’s complement number). A deviation from ideal value in this case is called Zero-g offset. Offset is to some extent a result of stress to a precise MEMS sensor and therefore the offset can slightly change after mounting the sensor onto a printed circuit board or exposing it to extensive mechanical stress. Offset changes little over temperature, see “Zero-g level change vs. temperature”. The Zero-g level of an individual sensor is stable over lifetime. The Zero-g level tolerance describes the range of Zero-g levels of a population of sensors. 2.5.3 Self test Self Test allows to check the sensor functionality without moving it. The Self Test function is off when the self-test bit of CTRL_REG1 (control register 1) is programmed to ‘0‘. When the self-test bit of ctrl_reg1 is programmed to ‘1‘ an actuation force is applied to the sensor, simulating a definite input acceleration. In this case the sensor outputs will exhibit a change in their DC levels which is related to the selected full scale through the device sensitivity. When Self Test is activated, the device output level is given by the algebraic sum of the signals produced by the acceleration acting on the sensor and by the electrostatic test-force. If the output signals change within the amplitude specified inside Table 3, than the sensor is working properly and the parameters of the interface chip are within the defined specification. 2.5.4 Click and double click recognition The Click and Double Click recognition functions help to create man-machine interface with little software overload. The device can be configured to output an interrupt signal on dedicated pin when tapped in any direction. If the sensor is exposed to a single input stimulus it generates an interrupt request on inertial interrupt pin (INT1 and/or INT2). A more advanced feature allows to generate and interrupt request when a “double click” with programmable time between the two events enabling a “mouse button like” use. This function can be fully programmed by the user in terms of expected amplitude and timing of the stimuli. |
|
Link URL |
| Czy Alldatasheet okazała się pomocna? [ DONATE ] |
O Alldatasheet | Reklama | Kontakt | Polityka prywatności | Link do karty katalogowej | Linki | Lista producentów All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |