MPC5643L datasheet(22/136 Pages) FREESCALE

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MPC5643L Microcontroller Data Sheet, Rev. 8.1

Introduction

Freescale Semiconductor

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Single high supply required: nominal 3.3 V both for packaged and Known Good Die option

— Packaged option requires external ballast transistor due to reduced dissipation capacity at high temperature but

can use embedded transistor if power dissipation is maintained within package dissipation capacity (lower

frequency of operation)

— Known Good Die option uses embedded ballast transistor as dissipation capacity is increased to reduce system

cost

•

All I/Os are at same voltage as external supply (3.3 V nominal)

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Duplicated Low-Voltage Detectors (LVD) to guarantee proper operation at all stages (reset, configuration, normal

operation) and, to maximize safety coverage, one LVD can be tested while the other operates (on-line self-testing

feature)

1.5.41

Built-In Self-Test (BIST) capability

This device includes the following protection against latent faults:

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Boot-time Memory Built-In Self-Test (MBIST)

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Boot-time scan-based Logic Built-In Self-Test (LBIST)

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Run-time ADC Built-In Self-Test (BIST)

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Run-time Built-In Self Test of LVDs

MPC5643L Arkusz danych(PDF) 22 Page - Freescale Semiconductor, Inc