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Zakładka z wyszukiwarką danych komponentów |
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Zakładka z wyszukiwarką danych komponentów |
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STLC3055N Arkusz danych(PDF) 26 Page - STMicroelectronics |
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STLC3055N Arkusz danych(HTML) 26 Page - STMicroelectronics |
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26 / 34 page  Electrical characteristics STLC3055N 26/34 6.1 Test circuits Referring to the application diagram shown in Figure 8 on page 20 and using as external components the typical values specified in the Table 10 on page 17 and Table 11 on page 18, find below the proper configuration for each measurement. All measurements requiring DC current termination should be performed using "Wandel & Goltermann DC Loop Holding Circuit GH-1" or equivalent. Figure 10. 2W return loss 2WRL = 20Log(|Zref + Zs|/|Zref-Zs|) = 20Log(E/2Vs) Figure 11. THL trans hybrid loss THL = 20Log|Vrx/Vtx| Figure 12. G24 transmit gain G24 = 20Log|2Vtx/E| TIP RING RX TX STLC3055N application circuit W&G GH1 Zref E Vs 1Kohm 1Kohm 100 μF 100mA DC max Zin = 100K 200 to 6kHz 600ohm 100 μF TIP RING RX TX STLC3055N application circuit W&G GH1 Vrx Vtx 100 μF 100 μF 100mA DC max Zin = 100K 200 to 6kHz 600ohm TIP RING RX TX STLC3055N application circuit W&G GH1 E Vtx 100 μF 100 μF 100mA DC max Zin = 100K 200 to 6kHz 600ohm |
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