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AD5560JBCZ Arkusz danych(PDF) 33 Page - Analog Devices |
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AD5560JBCZ Arkusz danych(HTML) 33 Page - Analog Devices |
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33 / 68 page ![]() Data Sheet AD5560 Rev. D | Page 33 of 68 DIE TEMPERATURE SENSOR AND THERMAL SHUTDOWN There are three types of temperature sensors in the AD5560. • The first is a temperature sensor available on the MEASOUT pin and expressed in voltage terms. Nominally at 25°C, this sensor reads 1.54 V. It has a temperature coefficient of 4.7 mV/°C. This sensor is active during power-down mode. Die Temp = (VMEASOUT(TSENSE) − 1.54)/0.0047 + 25°C Based on typical temperature sensor output voltage at 25°C and output scaling factor. • The second type of temperature sensor is related to the thermal shutdown feature in the device. Here, there are sensors located in the middle of the enabled power stage, which are used to trip the thermal shutdown. The thermal shutdown feature senses only the power stages, and the power stage that it senses is determined by the active stage. If ranges of <25 mA are selected, the EXTFORCE1 sensor is monitored. The EXTFORCE1 power stage itself is made up of three identical stages, but the thermal shutdown is activated by only one stage (EXTFORCE1B). Similarly, the EXTFORCE2 stage is made up of two identical output stages, but the thermal shutdown can be activated by only one stage (EXTFORCE2A). The thermal shutdown circuit monitors these sensors and, in the event of the die temperature exceeding the program- mable threshold temperature (100°C, 110°C, 120°C, 130°C (default)), the device protects itself by inhibiting the force amplifier stage, clearing SW-INH in DPS Register 1 and flagging the overtemperature event via the open-drain TMPALM pin, which can be programmed to be either latched or unlatched. These temperature sensors can be read via the MEASOUT pin by selecting them in the diagnostic register (Table 23, VPTAT low and VPTAT high). They are expressed in voltage and to scale to temperature. They must be referred to the VTSD reference voltage levels (see Table 23) also available on MEASOUT. This set of sensors is not active in power-down mode. Die Temp_y = {(VPTAT_x − VTSD_low)/[(VTSD_high − VTSD_low)/(Temp_high – Temp_low)]} + Temp_low where: x, y are (high, NPN) and (low, PNP). Temp_low = −273°C. Temp_high = +130°C. • The third set of temperature sensors is an array of thermal diodes scattered across the die. These diodes allow the user to evaluate the temperature of different parts of the die and are of great use to determine the temperature gradients across the die and the temperature of the accurate portions of the die when the device is dissipating high power. For further details on the thermal array and locations, see the diagnostic register section in Table 23. These diodes can be muxed out onto the GPO pin. The diagnostic register (Address 0x7) details the addressing and location of the diodes. These can be used for diagnostic purposes to determine the thermal gradients across the die and across a board containing many AD5560 devices. When selected, the anode of each diode is connected to GPO and the cathode to AGND. The AD5560 evaluation board uses the ON Semiconductor ADT7461 temperature sensor for the purpose of analyzing the temperature at different points across the die. Note that, when a thermal shutdown occurs, as the force amplifier is inhibited or tristated, user intervention is required to reactivate the device. It is necessary to clear the temperature alarm flag by issuing a read command of Register Address 0x44 (alarm status and clear alarm status register, Table 25), and then issuing a new write to the DPS Register 1 (SW-INH = 1) to reenable the force amplifier. See also the Thermal Considerations section. MEASURE OUTPUT (MEASOUT) The measured DUT voltage, current (voltage representation of DUT current), KSENSE, or die temperature is available on MEASOUT with respect to AGND. The default MEASOUT range is the forced voltage range for voltage measure and current measure (nominally ±12.81 V, depending on reference voltage and offset DAC) and includes overrange to allow for system error correction. The serial interface allows the user to select another MEASOUT range of (1.025 × VREF) to AGND; this range is suitable for use with an ADC with a smaller input range. To allow for system error correction, there is additional gain for the force function. If this overrange is used as intended, the output range on MEASOUT scales accordingly. The MEASOUT line can be tristated via the serial interface. When using low supply voltages, ensure that there is sufficient headroom and footroom for the required force voltage range. VMID VOLTAGE The midcode voltage (VMID) is used in the measure current amplifier block to center the current ranges at about 0 A. This is required to ensure that the quoted current ranges can be achieved when using offset DAC settings other than the default. VMID corresponds to 0x8000 or the DAC midcode value, that is, the middle of the voltage range set by the offset DAC setting (see Table 15 and Figure 56). VMID = 5.125 × VREF × (32,768/216) − (5.125 × VREF × (OFFSET_DAC_CODE/216)) or VMID = 5.125 × VREF × ((32,768 − Offset DAC)/216) |
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