| Zakładka z wyszukiwarką danych komponentów |
|
STM32L152C6 Arkusz danych(PDF) 55 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
STM32L152C6 Arkusz danych(HTML) 55 Page - STMicroelectronics |
|
55 / 131 page ![]() DocID17659 Rev 9 55/131 STM32L151x6/8/B, STM32L152x6/8/B Electrical characteristics 105 6.3.3 Embedded internal reference voltage The parameters given in the following table are based on characterization results, unless otherwise specified. Table 15. Embedded internal reference voltage calibration values Calibration value name Description Memory address VREFINT_CAL Raw data acquired at temperature of 30 °C, VDDA= 3 V 0x1FF8 0078-0x1FF8 0079 Table 16. Embedded internal reference voltage Symbol Parameter Conditions Min Typ Max Unit VREFINT out(1) Internal reference voltage – 40 °C < TJ < +105 °C 1.202 1.224 1.242 V IREFINT Internal reference current consumption - - 1.4 2.3 µA TVREFINT Internal reference startup time - - 2 3 ms VVREF_MEAS VDDA and VREF+ voltage during VREFINT factory measure - 2.99 3 3.01 V AVREF_MEAS Accuracy of factory-measured VREF value (2) Including uncertainties due to ADC and VDDA/VREF+ values -- ±5 mV TCoeff(3) Temperature coefficient –40 °C < TJ < +105 °C - 20 50 ppm/°C 0 °C < TJ < +50 °C - - 20 ACoeff(3) Long-term stability 1000 hours, T= 25 °C - - 1000 ppm VDDCoeff(3) Voltage coefficient 3.0 V < VDDA < 3.6 V - - 2000 ppm/V TS_vrefint(3)(4) ADC sampling time when reading the internal reference voltage -5 10 - µs TADC_BUF(3) Startup time of reference voltage buffer for ADC -- - 10 µs IBUF_ADC(3) Consumption of reference voltage buffer for ADC - - 13.5 25 µA IVREF_OUT(3) VREF_OUT output current(5) -- - 1 µA CVREF_OUT(3) VREF_OUT output load - - - 50 pF ILPBUF(3) Consumption of reference voltage buffer for VREF_OUT and COMP - - 730 1200 nA VREFINT_DIV1(3) 1/4 reference voltage - 24 25 26 % VREFINT VREFINT_DIV2(3) 1/2 reference voltage - 49 50 51 VREFINT_DIV3(3) 3/4 reference voltage - 74 75 76 1. Tested in production. 2. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes. 3. Guaranteed by design, not tested in production. 4. Shortest sampling time can be determined in the application by multiple iterations. 5. To guarantee less than 1% VREF_OUT deviation. |
|
Link URL |
| Czy Alldatasheet okazała się pomocna? [ DONATE ] |
O Alldatasheet | Reklama | Kontakt | Polityka prywatności | Link do karty katalogowej | Linki | Lista producentów All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |