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AN4402 Arkusz danych(PDF) 30 Page - STMicroelectronics |
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AN4402 Arkusz danych(HTML) 30 Page - STMicroelectronics |
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30 / 39 page ![]() Energy capability and load compatibility AN4402 30/39 DocID025557 Rev 1 Figure 16 displays the maximum allowed current of outputs 1, 2 or 3 (configurable outputs) in low-side configuration, driving an inductive load. Different conditions (single or repetitive pulses) and start temperature (junction temperature right before the switch-off phase of the MOSFET) are considered. The test conditions for these curves are VBAT = 13.5 V and RL = 0 Ω. These conditions are different from the application conditions and are therefore not directly applicable to our specific case. One way to verify the load compatibility consists in building the curve EDEMAG,MAX versus the corresponding tDEMAG from the relevant I-L plot of Figure 16, where EDEMAG,MAX is the maximum energy which the device can sustain. Condition 1: The jump start conditions (VBAT,MAX = 24 V) have a very low probability of occurrence. The single pulse is applicable. From Figure 17, we see that the energy capability of the device for a single pulse at 11.7ms is higher than the energy dissipated in the application conditions. Figure 17. EDEMAG_MAX vs tDEMAG for a single pulse TJSTART = 150°C Condition 2 (VBAT,TYP = 13.5 V) corresponds to the nominal conditions with TJ = 100 °C: The repetitive pulse condition is applicable. Building the curve EDEMAG,MAX versus the corresponding tDEMAG for repetitive pulses at TJSTART = 100 °C from Figure 16, we obtain Table 14 and Figure 18. Table 13. EDEMAG_MAX and corresponding tDEMAG for a single pulse, TJSTART = 150°C, RL = 0 Ω, VBAT = 13.5 V L [mH] IL0 [A] tDEMAG [ms] RL = 0 Ω VBAT = 13.5 V EDEMAG_MAX [mJ] RL = 0 Ω VBAT = 13.5 V 400 0.542 9.9 93 500 0.536 12.2 114 600 0.530 14.4 134 700 0.525 16.7 153 |
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