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AN4007 Arkusz danych(PDF) 30 Page - STMicroelectronics |
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AN4007 Arkusz danych(HTML) 30 Page - STMicroelectronics |
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30 / 33 page ![]() Thermal measurements AN4007 30/33 Doc ID 022455 Rev 2 4 Thermal measurements A thermal analysis of the board was performed using an IR camera. The board was submitted to full load at nominal input voltage and the thermal map was taken 15 min. after the power-on at ambient temperature (25 °C). Figure 34 and 35 show the results. Figure 34. Thermal map at 115 VAC and full load Figure 35. Thermal map at 230 VAC and full load |
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