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ST7 AND ST9 PERFORMANCE BENCHMARKING

9 MEASUREMENT PROCEEDING AND CALCULATION

This section describes measurement proceeding and calculation for computing performance

test routines only. Interrupt processing performance test routines are not concerned

(see <Italic>6.2 Core interrupt processing performance<Italic end> for details on measure

and calculation).

9.1 MEASUREMENT PROCEEDING

The parameters measured are execution time and code size. The first has been measured

on MCU boards (thanks to an oscilloscope) whenever possible, or with the assembly code.

The second has been measured on the assembly code.

To facilitate execution time measurement, assembly code has been divided in two parts. The

first, called Assignments & Initializations in the source code, contains the initialization of the

MCU and data and then a call to the test routine; which is included in the second part, called

Test Loop. The first part ends with an infinite loop. The execution time and code size will

obviously be measured on Test Loop part.

9.1.1 Execution time measure

An I/O pin is used to make the measure, thanks to a digital oscilloscope. This I/O pin is

configured as an output, with a push-pull, and interrupts are disabled in the initialization part.

The pin used for each MCU is detailed in Table 13.

Table 13. I/O pins for execution time measuring

The Test Loop routine begins with the set of the I/O pin. This marks the beginning of the test

MCU name

I/O pin for measure

80C51XA

pin 0 of port 2

68HC16

pin 2 of port E

68HC12

pin 7 of port E

ST9+

pin 0 of port 4

ST9

pin 0 of port 4

H8/300

pin 0 of port 6

68HC11

pin 0 of port B

68HC08

pin 0 of port A

ST7

pin 0 of port B

80C51

pin 0 of port 1

KS88

pin 0 of port 2 (for 88C0504)

pin 0 of port 4 (for 88C0116)

78K0

pin 0 port 2

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