AN3307 datasheet(30/37 Pages) STMICROELECTRONICS

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Class B solution structure

AN3307

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Doc ID 18186 Rev 4

5.4

Description of periodic runtime self-tests

5.4.1

Runtime self-test structure

The Runtime self-test is a block of tests which is performed periodically at the main loop

level. The execution period of the block is based on timebase interrupt settings. Before the

first run, all the tests included must be initialized by the runtime initialization phase block

(refer to Figure 5). Most of these tests are performed at the main loop level. Only the partial

transparent RAM test and the backup of the latest clock measurement results are performed

in the SysTick timer interrupt service routine at proper configurable intervals, signaled by

TimeBaseFlag settings. It includes the following self-tests:

–

CPU core partial runtime test

–

Stack boundaries overflow test

–

Clock runtime test

–

AD MUX self-test (not implemented)

–

Interrupt rate test (not implemented)

–

Communication peripherals test (not implemented)

–

Flash partial CRC test including evaluation of the complete test

–

Independent and window watchdog refresh

–

Partial transparent RAM March C-/X test (under system interrupt scope)

Figure 15.

Periodic runtime self-test and timebase interrupt service structure

Note:

Tests of the analog part, communication peripherals and application interrupts are not

included and their implementation depends on the specific microcontroller device

capabilities and user application needs.

MS18901V1

Partial CPU core test

Stack boundaries test

Clock test

Partial Flash test

Control flow check

IWDG and WWDG refresh

Fail

Interrupt rate test

Comm peripherals test

A/D MUX test

Not

implemented

Fail Safe routine

Partial

RAM test

Return

Fail

SysTick ISR

From main

Resume main

TB_Flag?

Tick> Time

Base?

Tick++

TB_Flag= False

Tick= 0

TB_Flag = True

True

False

Yes

Clock measurement

Fail

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