| Zakładka z wyszukiwarką danych komponentów |
|
STM32L010RB Arkusz danych(PDF) 75 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
STM32L010RB Arkusz danych(HTML) 75 Page - STMicroelectronics |
|
75 / 89 page ![]() DS12319 Rev 3 75/89 STM32L010RB Electrical characteristics 82 Figure 22. ADC accuracy characteristics Table 54. ADC accuracy(1)(2)(3) Symbol Parameter Conditions Min Typ Max Unit ET Total unadjusted error 1.8 V < VDDA < 3.6 V, Range 1, 2 and 3 -2 4 LSB EO Offset error - 1 2.5 EG Gain error - 1 2 EL Integral linearity error - 1.5 2.5 ED Differential linearity error - 1 1.5 ENOB Effective number of bits 10.2 11 - bits Effective number of bits (16-bit mode oversampling with ratio =256)(4) 11.3 12.1 - SINAD Signal-to-noise distortion 62 67.8 - dB SNR Signal-to-noise ratio 63 68 - Signal-to-noise ratio (16-bit mode oversampling with ratio =256)(4) 70 76 - THD Total harmonic distortion - -81 -68.5 1. ADC DC accuracy values are measured after internal calibration. 2. ADC accuracy vs. negative current injection: Injecting negative current on any of the standard (non-robust) analog input pins must be avoided as it significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to standard analog pins that may potentially inject negative current. Any positive current injection within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.12 does not affect the ADC accuracy. 3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges. 4. This number is obtained by the test board without additional noise, resulting in non-optimized value for oversampling mode. ET = total unajusted error: maximum deviation between the actual and ideal transfer curves. EO = offset error: maximum deviation between the first actual transition and the first ideal one. EG = gain error: deviation between the last ideal transition and the last actual one. ED = differential linearity error: maximum deviation between actual steps and the ideal ones. EL = integral linearity error: maximum deviation between any actual transition and the end point correlation line. (1) Example of an actual transfer curve (2) The ideal transfer curve (3) End point correlation line 4095 4094 4093 7 6 5 4 3 2 1 0 23 4 5 6 1 7 4093 4094 4095 4096 VDDA VSSA EO ET EL EG ED 1 LSB IDEAL (1) (3) (2) MS19880V2 |
|
Link URL |
| Czy Alldatasheet okazała się pomocna? [ DONATE ] |
O Alldatasheet | Reklama | Kontakt | Polityka prywatności | Link do karty katalogowej | Linki | Lista producentów All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |