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APM32F103C8T6-R Arkusz danych(PDF) 54 Page - Geehy Semiconductor Co., Ltd.

Numer części APM32F103C8T6-R
Szczegółowy opis  Arm® Cortex® -M3 based 32-bit MCU
PDF  78 Pages
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Producent  GEEHY [Geehy Semiconductor Co., Ltd.]
Strona internetowa  https://global.geehy.com/
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P a g e 53
TS (cycle)
tS(
μs)
Maximum RAIN
(kΩ)
1.5
0.11
1.2
7.5
0.54
10
13.5
0.96
19
28.5
2.04
41
41.5
2.96
60
55.5
3.96
80
71.5
5.11
104
239.5
17.1
350
1.
Guaranteed by design and not tested in production.
Table43 ADC Accuracy (1) (2)
Symbol
Parameter
Test conditions
Typical
value
Maximum
value (3)
Unit
ET
Composite error
fPCLK2=56MHz,
fADC=14MHz,RAIN
<10KΩ,
VDDA=2.4~3.6V,TA=-40~105℃
Measurement is conducted after
ADC calculation
±2.5
±4.5
LSB
EO
Offset error
±1.0
±2
EG
Gain error
±2.0
±3.5
ED
Differential linear
error
±1.5
±3
EL
Integral linear
error
±2.5
±4
1.
DC accuracy value of ADC is measured after internal calibration.
2.
The backward injection of current will significantly affect the ADC accuracy. It is recommended to add a
Schottky diode (between the pin and the ground) on the standard analog pin that may generate
backward injection of current.
As long as the forward injection current is within the range of IINJ (PIN)
and ΣIINJ (PIN) given in 5.9, the ADC
accuracy will not be affected.
3.
It is assessed value.
5.12.1.2 Test of Built-in Reference Voltage Characteristics
Table44 Built-in Reference Voltage Characteristics
Symbol
Parameter
Condition
Minimum
value
Typical
value
Maximum
value
Unit



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