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APM32F103C8T6-R Arkusz danych(PDF) 55 Page - Geehy Semiconductor Co., Ltd. |
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APM32F103C8T6-R Arkusz danych(HTML) 55 Page - Geehy Semiconductor Co., Ltd. |
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55 / 78 page ![]() w w w. g e e h y. c o m P a g e 54 Symbol Parameter Condition Minimum value Typical value Maximum value Unit VREFINT(1) Built-in Reference Voltage -40℃ < TA < +125℃ VDD= 2-3.6 V 1.16 1.21 1.26 V TS_vrefint(2) Sampling time of ADC when reading out internal reference voltage - - 5.1 17.1 μs VREFINT Change of built-in reference voltage value in the full temperature range VDD=3V±10mV - - 10 mV TCoeff - - - - 126 ppm/ ℃ 1. The data are obtained from a comprehensive evaluation and are not tested in production. 2. Guaranteed by design and not tested in production. 5.13 Temperature sensor characteristics Table45 Temperature Sensor Characteristics Symbol Parameter Minimum value Typical value Maximum value Unit Avg_Slope(1) Average slope (VDD = 3.3V, TA = -40~105 ℃) 2.7 3.6 3.9 mV/ºC V25 Voltage at 25ºC (VDD = 2.0-3.6V) 1.38 1.41 1.45 V tSTART(2) Setup time 4 - 10 μs TS_temp(2)(3) ADC sampling time when reading the temperature - - 17.1 μs 1. Guaranteed by characteristic analysis and not tested in production. 2. Guaranteed by design and not tested in production. 3. The minimum sampling time can be determined by multiple loops in the application. |
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