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N5393D Arkusz danych(PDF) 3 Page - Keysight Technologies |
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N5393D Arkusz danych(HTML) 3 Page - Keysight Technologies |
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3 / 25 page ![]() 03 | Keysight | N5393D PCI Express® 3.0 (Gen3) Software for Infiniium Oscilloscopes - Data Sheet Verify and debug your PCI Express® designs more easily Keysight Technologies, Inc. PCI Express electrical performance validation and compliance software provides you with a fast and easy way to verify and debug your PCI Express 3.0, 2.0, and 1.1/1.0a designs for both silicon validation (as per the PCIe® BASE specification) as well as for add-in cards and motherboard systems (as per the PCIe CEM specification). The PCI Express electrical test software allows you to automatically execute PCI Express electrical transmitter tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test. The PCI Express electrical test software utilizes the prescribed test methods and algorithms as required by the PCI Express Card Electromechanical (CEM) specifications for all current PCI Express Standards. This produces results that are not only consistent with the PCI-SIG® SigTest utility, but also provides you with a fast and easy means of executing complex two-port motherboard tests and single port add-in card test with total automation. In addition to transmitter testing, the PCI Express electrical test software also provides an optional receiver test calibration test suite, which allows you to setup your N4903B JBERT bit error ratio tester for performing PCI Express 3.0 jitter tolerance testing under the PCIe 3.0 BASE specification. The PCI Express electrical performance validation and compliance software performs a wide range of electrical tests as per the PCI Express PCI Express 2.0 and 1.1/1.0a. electrical specifications for add-in cards and motherboard systems as documented in Section 4 of the base specification and Section 4 of the card electromechanical specification. Tests for PCI Express 3.0 (based on section 4.3.3.10 and 4.3.3.13) are also included to help you test your products against for the next generation of this powerful I/O technology. In addition to full swing (800 mV) testing, the software also supports testing for low-power, half-swing devices (400 mV) as per the PCI Express Architecture Mobile Graphics Low-Power Addendum to the PCI Express Base Specification Revision 1.0. 1. Peripheral Component Interconnect Special Interest Group |
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