TS1005 datasheet(3/11 Pages) TOUCHSTONE

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TS1005

TS1005DS r1p0

Page 3

RTFDS

ELECTRICAL CHARACTERISTICS

VDD = +1.8V, VSS = 0V, VINCM = VSS; RL = 100kΩ to (VDD-VSS)/2; TA = -40°C to +85°C, unless otherwise noted.

Typical values are at TA = +25°C. See Note 1

Parameters

Symbol

Conditions

Min

Typ

Max

Units

Supply Voltage Range

VDD-VSS

0.8

5.5

Supply Current

ISY

RL = Open circuit

TA = 25°C

1.3

1.6

µA

-40°C ≤ TA ≤ 85°C

1.8

Input Offset Voltage

VOS

VIN = VSS or VDD

TA = 25°C

0.8

-40°C ≤ TA ≤ 85°C

Input Offset Voltage Drift

TCVOS

µV/°C

Input Bias Current

IIN+, IIN-

VIN+, VIN- = (VDD - VSS)/2

TA = 25°C

-40°C ≤ TA ≤ 85°C

100

Input Offset Current

IOS

Specified as IIN+ - IIN-

VIN+, VIN- = (VDD - VSS)/2

TA = 25°C

-40°C ≤ TA ≤ 85°C

Input Voltage Range

IVR

Guaranteed by Input Offset Voltage Test

VSS

VDD

Common-Mode Rejection Ratio

CMRR

Vdd = 5.5V, 0V ≤ VIN(CM) ≤ 5.0V

TA = 25°C

-40°C ≤ TA ≤ 85°C

Power Supply Rejection Ratio

PSRR

0.8V ≤ (VDD - VSS) ≤ 5.5V

TA = 25°C

-40°C ≤ TA ≤ 85°C

Output Voltage High

VOH

Specified as VDD - VOUT,

RL = 100kΩ to VSS

TA = 25°C

3.7

-40°C ≤ TA ≤ 85°C

Specified as VDD - VOUT,

RL = 10kΩ to VSS

TA = 25°C

-40°C ≤ TA ≤ 85°C

Output Voltage Low

VOL

Specified as VOUT - VSS,

RL = 100kΩ to VDD

TA = 25°C

1.5

-40°C ≤ TA ≤ 85°C

Specified as VOUT - VSS,

RL = 10kΩ to VDD

TA = 25°C

-40°C ≤ TA ≤ 85°C

Short-circuit Current

ISC+

VOUT = VSS

TA = 25°C

-40°C ≤ TA ≤ 85°C

ISC-

VOUT = VDD

TA = 25°C

-40°C ≤ TA ≤ 85°C

Open-loop Voltage Gain

AVOL

VSS+50mV ≤ VOUT ≤ VDD-50mV

TA = 25°C

110

-40°C ≤ TA ≤ 85°C

Gain-Bandwidth Product

GBWP

RL = 100kΩ to VSS, CL = 20pF

kHz

Phase Margin

φM

Unity-gain Crossover,

RL = 100kΩ to VSS, CL = 20pF

degrees

Slew Rate

RL = 100kΩ to VSS, AVCL = +1V/V

7.5

V/ms

Full-power Bandwidth

FPBW

FPBW = SR/(π • VOUT,PP); VOUT,PP = 0.7VPP

3400

Input Voltage Noise Density

f = 1kHz

0.6

µV/

√Hz

Input Current Noise Density

f = 1kHz

pA/

√Hz

Note 1: All specifications are 100% tested at TA = +25°C. Specification limits over temperature (TA = TMIN to TMAX) are guaranteed by

device characterization, not production tested.

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